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|MANUFACTURER||FEI UK LTD|
|MODEL||Quanta 200 3d|
|TRAINING||No special training required.|
|CALIBRATED||Yes, this item is calibrated.|
|CONTACT 1||PROF SARAH GABBOTT|
|CONTACT 2||VINAY PATEL|
|Enquire about this item|
The Quanta 200 3D is a dual-beam scanning electron microscope (SEM) and focused ion beam (FIB) instrument. Combining these two techniques creates a versatile tool for sub-micron scale material removal and characterization. This microscope is mainly usedfor preparing site-specific cross sectional specimens for transmission electron microscopes (TEM).
Features of the Quanta200 include: •SE Detector
•OXFORD INSTRUMENTS EDX DETECTOR
SUB MICRON RESLOUTION WITH EDX ANALYSIS
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Last Updated: 5th June, 2018