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|MANUFACTURER||Jeol (Uk) Ltd|
|MODEL||2100 Electron Microscope,|
|AVAILABILITY||By appointment only|
|RESTRICTIONS||Only University of Leicester staff members can use the equipment|
|TRAINING||Training is required to use this item and we can arrange this if needed.|
|CALIBRATED||Yes, this item is calibrated.|
|CONTACT 1||PROF SARAH GABBOTT|
|CONTACT 2||Vinay Patel|
|Enquire about this item|
The JEM-2100 is a multipurpose, 200 kV analytical electron microscope. It has ultrahigh TEM resolution as high as 0.19nm allowing for observation at atomic resolution. STEM (Scanning Transmission Electron Microscope: option) function integrated in PC control system allows a scanning image of a sample at nanometer resolution. The EDS (Energy Dispersive X-ray Spectrometer) has a 0.28sr of solid angle allowing for highly sensitive analysis at nanometer resolution. The highly stable specimen stage permits long term observation and analysis.
STEM IMAGING , EDX, DIFFRACTION PATTERNS
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Last Updated: 5th June, 2018