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Quanta 200 focused Ion beam scanning electron microscope
| MANUFACTURER | FEI UK LTD |
|---|---|
| MODEL | Quanta 200 3d |
| TRAINING | No special training required. |
|---|---|
| CALIBRATED | Yes, this item is calibrated. |
| CONTACT 1 | PROF SARAH GABBOTT |
|---|---|
| CONTACT 2 | VINAY PATEL |
| Enquire about this item |
Description
The Quanta 200 3D is a dual-beam scanning electron microscope (SEM) and focused ion beam (FIB) instrument. Combining these two techniques creates a versatile tool for sub-micron scale material removal and characterization. This microscope is mainly usedfor preparing site-specific cross sectional specimens for transmission electron microscopes (TEM).
Features of the Quanta200 include: •SE Detector
•OXFORD INSTRUMENTS EDX DETECTOR
Specification
SUB MICRON RESLOUTION WITH EDX ANALYSIS
Item ID #.
Last Updated: 5th June, 2018
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