Enquire Now

Quanta 200 focused Ion beam scanning electron microscope

MANUFACTURER FEI UK LTD
MODEL Quanta 200 3d
TRAINING No special training required.
CALIBRATED Yes, this item is calibrated.
CONTACT 1 PROF SARAH GABBOTT
CONTACT 2 VINAY PATEL
Enquire about this item

Description

The Quanta 200 3D is a dual-beam scanning electron microscope (SEM) and focused ion beam (FIB) instrument. Combining these two techniques creates a versatile tool for sub-micron scale material removal and characterization. This microscope is mainly usedfor preparing site-specific cross sectional specimens for transmission electron microscopes (TEM).

Features of the Quanta200 include: •SE Detector

•OXFORD INSTRUMENTS EDX DETECTOR

Specification

SUB MICRON RESLOUTION WITH EDX ANALYSIS

Item ID #1020.

Last Updated: 5th June, 2018

Quanta 200 focused Ion beam scanning electron microscope

There are no publically available categories listed at present. You may have to sign in to browse this catalogue.