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Quanta 200 focused Ion beam scanning electron microscope
THE FIB SEM CAN BE USED TO CREATE TEM SAMPLES AND THIN FOILS ALONG WITH USING GALIUM IONS TO MILL THROUGH THE SURFACE OF AN SAMPLE TO CREATE A CROSS SECTION WITH THE LEAST AMOUNT OF DAMANAGE POSSIBLE. THE MILLING CAN BE SITE SPECFIC DOWN TO NM RESOLO
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